1. Modifying the nanocrystalline characteristics—structure, size, and surface states of copper oxide thin films by high-energy heavy-ion irradiation
- Author
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B. Balamurugan, D.K. Avasthi, G. Raghavan, S. M. Shivaprasad, Fouran Singh, M. Rajalakshmi, A.K. Tyagi, Bodh Raj Mehta, and Akhilesh K. Arora
- Subjects
Materials science ,Physics::Instrumentation and Detectors ,Analytical chemistry ,General Physics and Astronomy ,Nanocrystalline material ,Ion ,Condensed Matter::Materials Science ,symbols.namesake ,X-ray photoelectron spectroscopy ,Ellipsometry ,symbols ,Irradiation ,Thin film ,Raman spectroscopy ,Surface states - Abstract
In the present study, x-ray diffraction, Raman spectroscopy, spectroscopic ellipsometry, photoluminescence, and x-ray photoelectron spectroscopy techniques were used to study the effect of 120 MeV 107Ag9+ ion irradiation on nanocrystalline Cu2O thin films grown by the activated reactive evaporation technique. The influence of dense electronic excitations during ion irradiation on the structural and optical properties of the Cu2O thin films was studied. Experimental results demonstrate that the phase and the size of nanocrystallites in the Cu2O thin films as well as associated surface states can be tailored by controlling ion fluence. The Cu2O higher symmetry cubic phase is observed to be quite stable under a higher temperature and irradiation-induced thermal spikes, which accompanies ion irradiation.
- Published
- 2002