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Start Over Author "Bartolucci, F." Journal journal of applied physics
2 results on '"Bartolucci, F."'

1. Preparation and characterization of thin, well-ordered aluminum oxynitride films on NiAl(001)

Author

Bartolucci, F., Schmitz, G., Gassmann, P., and Franchy, R.

Subjects
Thin films -- Research, Physics
Abstract

The formation of thin aluminum oxynitride (AlON) layers after adsorption of nitric oxide on NiAl(001) at 75 K and subsequent annealing at 1200 K, was examined. The AlON film indicated a distinct (2X1) low-energy electron diffraction pattern and the high-resolution electron energy loss spectroscopy spectrum showed five loss peaks. An oxygen to nitrogen atomic ratio of about two was estimated from the Auger electron spectroscopy analysis.

Published
1996

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