1. Identification of F impurities in F-doped ZnO by synchrotron X-ray absorption near edge structures
- Author
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Kookrin Char, Deok-Yong Cho, Sukit Limpijumnong, Sutassana Na-Phattalung, Seungran Lee, Jaejun Yu, and Chul-Hee Min
- Subjects
010302 applied physics ,Materials science ,Doping ,Analytical chemistry ,General Physics and Astronomy ,02 engineering and technology ,021001 nanoscience & nanotechnology ,01 natural sciences ,XANES ,Synchrotron ,law.invention ,Pulsed laser deposition ,law ,Impurity ,0103 physical sciences ,Atom ,0210 nano-technology ,Absorption (electromagnetic radiation) ,Wurtzite crystal structure - Abstract
Synchrotron X-ray absorption near edge structure (XANES) measurements of F K-edge in conjunction with first-principles calculations are used to identify the local structure of the fluorine (F) atom in F-doped ZnO. The ZnO film was grown by pulsed laser deposition with an Nd:YAG laser, and an oxyfluoridation method was used to introduce F ions into the ZnO films. The measured XANES spectrum of the sample was compared against the first-principles XANES calculations based on various models for local atomic structures surrounding F atoms. The observed spectral features are attributed to ZnF2 and FO defects in wurtzite bulk ZnO.
- Published
- 2018
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