1. Deposition and characterization of a self-propagating CuO[sub x]/Al thermite reaction in a multilayer foil geometry.
- Author
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Blobaum, K. J., Reiss, M. E., Lawrence, J. M. Plitzko, and Weihs, T. P.
- Subjects
COPPER oxide ,SPUTTERING (Physics) ,X-ray diffraction ,TRANSMISSION electron microscopy ,OXIDATION-reduction reaction - Abstract
Self-propagating formation reactions have been studied in multilayer foils and they are currently being investigated for applications in joining and ignition. Here, we introduce a reactive multilayer foil which contains a reduction-oxidation thermite reaction between CuO[sub x] and Al. Typically in reactive multilayer foils, elemental layers react and form a single intermetallic product. In this thermite reaction, however, aluminum and copper oxide are, respectively, oxidized and reduced and form aluminum oxide and copper. The fully dense multilayer foils provide a well-defined geometry for studying the thermodynamics, kinetics, and intermediate phase formation in the CuO[sub x]/Al thermite reaction. Here, sputter deposition of CuO[sub x]/Al multilayer foils is demonstrated, and x-ray diffraction and transmission electron microscopy, including high resolution transmission electron microscopy and electron spectroscopic imaging, are used to characterize the as-deposited foil and the final products. The heat released in the reaction is quantified using differential thermal analysis, and the velocity of the self-propagating reaction is reported. © 2003 American Institute of Physics. [ABSTRACT FROM AUTHOR]
- Published
- 2003
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