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We recently published a study concerning femtosecond pump–probe absorption edge spectroscopy of cubic GaN (fundamental bandgap: 3.23 eV), resulting in the transient dielectric function. In the present study, we continue our investigations of those pump–probe measurements by determining the time-dependent transition energy at the Fermi-vector between the conduction and valence bands. The generation of electron–hole pairs by the 266 nm pump-beam (4.66 eV) shifts the absorption edge by ≈ 500 meV within 1 ps due to many-body effects like band-filling and bandgap renormalization. Modeling this ultra-fast change is achieved by converting the transition energies into free-carrier concentrations, assuming the electron contributions to be dominant. We consider the relaxation, recombination, and diffusion of those free-carriers as well as either an additional gain-recombination or temperature effects. This allows for describing the transition energies on short time scales. Both models yield similar values for the characteristic relaxation time (≈ 0.21 ps), recombination time (≈ 25 ps), and diffusion coefficient (≈ 1 cm 2 /s). [ABSTRACT FROM AUTHOR]

An ultra-fast change of the absorption onset for zincblende gallium-nitride (zb-GaN) (fundamental bandgap: 3.23 eV) is observed by investigating the imaginary part of the dielectric function using time-dependent femtosecond pump–probe spectroscopic ellipsometry between 2.9 and 3.7 eV. The 266 nm (4.66 eV) pump pulses induce a large electron–hole pair concentration up to 4 × 10 20 cm − 3 , which shift the transition energy between conduction and valence bands due to many-body effects up to ≈ 500 meV. Here, the absorption onset increases due to band filling while the bandgap renormalization at the same time decreases the bandgap. Additionally, the absorption of the pump-beam creates a free-carrier profile within the 605 nm zb-GaN layer with high free-carrier concentrations at the surface, and low concentrations at the interface to the substrate. This leads to varying optical properties from the sample surface (high transition energy) to substrate (low transition energy), which are taken into account by grading analysis for an accurate description of the experimental data. For this, a model describing the time- and position-dependent free-carrier concentration is formulated by considering the relaxation, recombination, and diffusion of those carriers. We provide a quantitative analysis of optical experimental data (ellipsometric angles Ψ and Δ) as well as a plot for the time-dependent change of the imaginary part of the dielectric function. [ABSTRACT FROM AUTHOR]