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The magnetic properties of Ce/Fe and CeHapproximately2/Fe multilayers is obtained by a detailed structural characterization of the ion beam sputtering of Ce/Fe and CeH2/Fe multilayers. The Monte Carlo simulations of the small-angle X-ray scattering diagrams are used to determine the extension of the interface of the Ce/Fe multilayers upto 5 to 7 angstroms. The Fe grows in an amorphous structure below a critical thickness of 25 angstroms, and the interface extension is increased. In CeH2/Fe multilayers, all the layers have abrupt interfaces.

Presents a study that grew yttrium-barium-copper-oxygen and bismuth-strontium-calcium-copper-oxygen-oxygen films in situ on amorphous silicon dioxide. Use of excimer laser ablation; Growth and orientation of the perovskite structures; Epitaxial growth on single-crystalline strontium-titanium-oxygen.