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We report on the magnetic coupling behavior in all-ferromagnetic La0.7Sr0.3MnO3/SrRuO3 (LSMO/SRO) heterostructures deposited on the SrTiO3 (111) substrate, where the interface leads to an enhanced exchange field as compared to the one deposited on SrTiO3 (001). Importantly, high-resolution scanning transmission electron microscopy reveals distinct interface structures of the (111) heterostructures depending on the growth sequence. The heterostructure with an SRO bottom layer shows an atomically flat and abrupt interface, while the one with an LSMO bottom layer shows a deformed interface due to the surface roughening of LSMO deposited directly on SrTiO3 (111). As a result, the heterostructure with an abrupt interface exhibits a robust antiferromagnetic coupling between LSMO and SRO, while the one with a rough interface shows negligible magnetic coupling. Our results demonstrate the key role of an abrupt interface in determining the magnetic properties of oxide heterostructures. [ABSTRACT FROM AUTHOR]

In the presence of structural disorders, carrier conduction via localized hopping sites emerges in two-dimensional systems and results in a unique thermopower characteristic with T1/3 dependence. The disorders induced potential differences of hopping sites leading to energy variations along current-carrying paths. A systematic thermoelectric study is presently required in comprehending the statistical effects. Therefore, we proposed a statistical model of the Seebeck coefficient on the basis of percolation theory and hopping mechanisms. With this model, the carrier density and temperature dependences can be practically predicted. Key parameters can be extracted by calibration to molybdenum disulfide and black phosphorus experiments, providing a deeper insight into device physics. Moreover, a Mott-like analytical model is developed to investigate the parametric dependence. The thermopower deviations from the noninteracting Mott picture at high and low temperatures are analyzed. Finally, the temperature dependence on the thermoelectric figure of merit is evaluated in a variable range hopping regime. Our model is essential for a reliable prediction of the disorder induced statistical effects on thermoelectric behaviors, which guides both device optimization and material engineering. [ABSTRACT FROM AUTHOR]

A surface potential based compact model for two-dimensional field effect transistors (2D-FETs) is proposed to incorporate the structural disorders induced transition behaviors among variable range hopping (VRH), nearest neighbor hopping (NNH), and band-like transport in most 2D materials. These functions coupled with effective transport energy and multiple trapping and releasing theory enable our developed model to predict the temperature and carrier density dependent current characteristics. Its validity is confirmed by the experimental results such as the metal insulator transition (MIT) in transition metal dichalcogenides and VRH-NNH transition in black phosphorus nanoribbon. Based on this model, the band-tail effects on the crossover gate voltage of MIT behavior are quantitatively investigated. It is found that the transition behavior is closely related to the distribution of the band-tail states. Furthermore, this model is implemented in Verilog-A for circuit-level prediction and evaluation of 2D-FETs to provide deeper insight into the relationship between material properties, device physics, and circuit performances. [ABSTRACT FROM AUTHOR]

The effect of deposition oxygen pressure (PO) on phase separation (PS) induced in epitaxial La0.67Ca0.33MnO3/NdGaO3(001) films was investigated. Fully oxygenated films grown at high PO are anisotropically strained. They exhibit PS over a wide temperature range, because of the large orthorhombicity of NdGaO3 substrates. The paramagnetic insulator-to-ferromagnetic metal (FM) and FM-to-antiferromagnetic insulator (AFI) transitions gradually shift to lower temperatures with decreasing PO. The AFI state is initially weakened (PO ≥ 30 Pa), but then becomes more robust against the magnetic field (PO < 30 Pa). The out-of-plane film lattice parameter increases with decreasing PO. For films grown at PO ≥ 30 Pa, the slight oxygen deficiency may enlarge the lattice unit cell, reduce the anisotropic strain, and suppress the AFI state. Films deposited at PO < 30 Pa instead experience an average compressive strain. The enhanced compressive strain and structural defects in the films may lead to the robust AFI state. These results aid our understanding of PS in manganite films. [ABSTRACT FROM AUTHOR]