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In this paper, an analytical model has been presented to study the influence of magnetic field on the impact ionization rate of charge carriers in semiconductors. The magnetic field is supposed to be applied along the oblique direction with respect to the direction of applied electric field. Numerical calculations have been carried out by using the comprehensive analytic expression of ionization rate of charge carriers formulated by the authors, in order to study the effect of oblique magnetic field on the ionization rate of electrons and holes moving under a steady electric field in 4H-SiC. Results show that the application of nonzero steady magnetic field in oblique direction leads to significant reduction in ionization rates. Moreover, the above-mentioned magnetic field-induced reduction in ionization rates is found to be maximum when the steady magnetic field is applied along the normal direction with respect to the external electric field.

In this paper, the authors have presented a self-consistent quantum drift-diffusion model for multiple quantum well (MQW) impact avalanche transit time (IMPATT) diodes. The bound states in MQWs have been taken into account by self-consistent solutions of the coupled classical drift-diffusion (CLDD) equations and time-independent Schrodinger equations associated with both the conduction and valence bands. The static and high-frequency properties of MQW DDR IMPATTs based on Si$$\sim $$~3C-SiC material system designed to operate near 94-GHz atmospheric window have been studied by means of the above-mentioned self-consistent solutions of coupled CLDD equations and Schrodinger equations followed by a well-established double-iterative field maximum computational technique. A symmetric and two complementary asymmetric doping profiles for the proposed structures have been taken into account for the present study. The RF power outputs of Si$$\sim $$~3C-SiC MQW DDR IMPATTs near 94 GHz obtained from the simulation are compared with the experimentally obtained power outputs of flat DDR IMPATT diodes based on Si, GaAs, and InP at the same frequency band. It is observed that Si$$\sim $$~3C-SiC MQW DDR IMPATTs are capable of delivering significantly higher RF power compared with IMPATTs based on the above-mentioned materials especially when the doping concentrations of 3C-SiC layers are kept higher than those of the Si layers.

In this paper, we study the effect of energy loss of charge carriers due to carrier-carrier interactions prior to impact ionization on the static and large-signal characteristics of double-drift region impact avalanche transit time (IMPATT) diodes based on Si designed to operate at millimeter-wave (mm-wave) atmospheric window frequencies such as 94, 140, and 220 GHz. The above mentioned effect has been incorporated in the simulation by taking into account a recently reported generalized analytical model of impact ionization rate of charge carriers based on multistage scattering phenomena in the base semiconductor. Results are compared with static and large-signal signal simulation results of the same diodes that we have reported earlier by taking into account the empirical relation of ionization rates fitted from the experimental data (experiment was carried out on IMPATT structures suitable for operating near 100 GHz). It is observed that both the large-signal RF power output and DC to RF conversion efficiency of the diodes are deteriorated significantly due to reduced ionization rates as a consequence of carrier-carrier collision events prior to the impact ionization. This effect is found to be more pronounced in 140 and 220 GHz diodes due to the enhanced carrier-carrier collisions within those diodes having greater background doping densities as compared to 94 GHz diode. The simulation results presented in this paper found to be in closer agreement with the experimental results as compared to the results that we have reported earlier.

In this paper, a two-dimensional (2-D) large-signal model has been presented to study the effect of steady magnetic field on the RF performance of millimeter-wave (mm-wave) double-drift region impact avalanche transit time device. Magnetic field sensitivities of various static and large-signal parameters of the device designed to operate at W-band have been calculated and discussed in detail. Results show that the frequency tuning of the source of around 3.64 GHz is achievable with maximum sensitivity of about $$-$$-1.59 GHz $$\hbox {T}^{-1}$$T-1 for the application of transverse magnetic field varying from 4.0 to 5.0 T. The nature of both frequency and power tuning of the device due to application of transverse magnetic field is in good agreement with the experimental results carried out earlier.

This paper contains additional validations of a comprehensive analytical model based on multistage scattering phenomena to evaluate the impact ionization rates of charge carriers in semiconductors which was proposed by the authors and reported earlier. The model has been used to evaluate the ionization rates of both electrons and holes in some potential wide bandgap (WBG) semiconductors such as Wurtzite-GaN (Wz-GaN), type-IIb diamond and 6H-SiC. The numerical results obtained from the analytical model within the respective electric field ranges under consideration have been compared with the ionization rate values calculated by using the empirical relations fitted from the experimentally measured data. The calculated values of impact ionization rates of electrons and holes in all the WBG semiconductors under consideration are found to be in close agreement with the experimental results.

The authors have developed a quantum corrected drift-diffusion model for impact avalanche transit time (IMPATT) devices by coupling the density gradient model with the classical drift-diffusion model. A large-signal simulation technique has been developed by incorporating the quantum potentials in the current density equations for the analysis of double-drift region IMPATT devices based on different semiconductors such as Wurtzite---GaN, InP, type-IIb diamond (C), 4H---SiC and Si deigned to operate at different millimeter-wave (mm-wave) and terahertz (THz) frequencies. It is observed that, the RF power output and DC to RF conversion efficiency of the devices operating at higher mm-wave ($$>$$>140 GHz) and THz frequencies reduce due to the incorporation of quantum corrections in the model; but the effect of quantum corrections are negligible for the devices operating at lower mm-wave frequencies ($$\le $$≤140 GHz).

In this paper, the quantum mechanical behavior of a reverse biased nano-scale $$p$$p-$$n$$n junction based on $$\hbox {Si/Si}_{0.4}\hbox {Ge}_{0.6}/\hbox {Si}$$Si/Si0.4Ge0.6/Si quantum well has been studied by obtaining the self-consistent solution of coupled Schrodinger and Poisson equations. The carrier confinement within the said quantum well structure has been investigated by analyzing the special variations of electron and hole densities throughout the device structure obtained from the self-consistent solution of coupled Schrodinger and Poisson equations for different widths of the quantum well. The tunnel current across the junction has also been calculated for the heterostructure for different applied reverse bias voltages. Results show that, due to the greater depth of the quantum well in conduction band as compared to that in valance band of $$\hbox {Si/Si}_{0.4}\hbox {Ge}_{0.6}/\hbox {Si}$$Si/Si0.4Ge0.6/Si heterostructure, the quantum confinement effect is more pronounced for electrons in conduction band as compared to that for holes in valance band. Finally the current-voltage characteristics of the heterostructure under consideration have been investigated for different widths of the quantum well. It is observed that the modulation of tunnel current may be achieved by varying the width of the quantum well. The present study is the groundwork for investigating the optoelectronic properties of nano-scale photodetectors based on $$\hbox {Si/Si}_{1-x}\hbox {Ge}_{x}/\hbox {Si}$$Si/Si1-xGex/Si material system capable of detecting longer wavelengths around 1.30 and 1.55 $$\upmu \hbox {m}$$μm.

A generalized analytical model based on multistage scattering phenomena has been developed in this paper for estimating the impact ionization rate of charge carriers in semiconductors. The probabilities of impact ionization initiated by electrons and holes have been calculated separately by taking into account all possible combinations of optical phonon scattering and carrier-carrier collisions prior to the impact ionization. Finally the analytical expressions of impact ionization rate of electrons and holes have been developed by using the aforementioned impact ionization probabilities. The impact ionization rates of electrons and holes in 4H-SiC have been calculated within the field range of $$2.5\times 10^{8}$$2.5×108---$$6.5\times 10^{8}\hbox { V m}^{-1}$$6.5×108Vm-1 by using the analytical expressions of those developed in the present paper. Those are also calculated by using the analytical expressions developed by some other researchers earlier without considering the multistage scattering phenomena. Finally the theoretical results obtained from the analytical model proposed in this paper and the analytical model developed by earlier researchers within the field range under consideration have been compared with the ionization rate values calculated by using the empirical relations fitted from the experimentally measured data. Closer agreement with the experimental data has been achieved when the impact ionization rate of charge carriers in 4H-SiC are calculated from the proposed model as compared to the earlier one.

Quantum correction is necessary on the classical drift-diffusion (CLDD) model to predict the accurate behavior of high frequency performance of ATT devices at frequencies greater than 200 GHz when the active layer of the device shrinks in the range of 150---350 nm. In the present work, a quantum drift-diffusion model for impact avalanche transit time (IMPATT) devices has been developed by incorporating appropriate quantum mechanical corrections based on density-gradient theory which macroscopically takes into account important quantum mechanical effects such as quantum confinement, quantum tunneling, etc. into the CLDD model. Quantum potentials (synonymous as Bohm potentials) have been incorporated in the current density equations as necessary quantum mechanical corrections for the analysis of millimeter-wave (mm-wave) and Terahertz (THz) IMPATT devices. It is observed that the large-signal (L-S) performance of the device is degraded due to the incorporation of quantum corrections into the model when the frequency of operation increases above 200 GHz; while the effect of quantum corrections are negligible for the devices operating at lower mm-wave frequencies.

The authors have proposed a complete large-signal (L-S) model to investigate the optical modulation of high frequency properties of double-drift region (DDR) impact avalanche transit time (IMPATT) devices operating at different millimeter-wave and sub-millimeter-wave frequencies. Simulation is carried out based on the proposed model to study the effect of photo-irradiation of different values of incident optical power of different wavelengths from 600---1000 nm on the DC and L-S characteristics of DDR IMPATTs based on Si designed to operate at 94, 140, 220, 300 and 500 GHz. Two different optical illumination configurations such as top mount and flip chip are taken into account for the present study. Results show that the maximum optical tuning of L-S parameters of the device can be achieved for optical illumination of wavelength 700 nm, i.e. near the wavelength corresponding to the responsivity peak of Si in both top mount and flip chip configurations. Further, better photo-sensitivity of top mount structure is observed as compared to its flip chip counterpart. The simulation results are found to be in good agreement with the experimental results reported earlier. Suitable tunable light source information is also suggested to carry out the optical control experiment within the wavelength range under consideration.

An attempt is made in this paper to study the influence of skin depth on the parasitic series resistance of millimeter-wave IMPATT devices based on Silicon. The method is based on the concept of depletion width modulation of the device under large-signal condition. A large-signal simulation model based on non-sinusoidal voltage excitation is used for this study. The electric field snap-shots of 35 GHz Single-Drift Region (SDR) and 94 GHz Double-Drift Region (DDR) IMPATT devices are first obtained from which the series resistances are estimated by incorporating the effect of skin depth in the modeling and simulation. The series resistances of these devices are also obtained by neglecting the effect of skin depth. The values of series resistances obtained from the simulation are compared with the corresponding experimentally reported values. It is observed that the series resistance estimated by including the skin effect is in closer agreement with the experimental values as compared to that without including the same. Thus the skin effect plays an important role for determining the series resistance of IMPATT devices at millimeter-wave frequency bands.