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Mixed-signal applications have emerged as a significant trend in the semiconductor industry, with considerable efforts directed towards developing fast and accurate designs that integrate both analog and digital components. However, mixed-signal verification presents a major challenge due to the slow verification time and limited robustness of traditional verification techniques. In this study, a verification architecture for a successive-approximation register (SAR) analog-to-digital converter (ADC) real number model (Real Number Modeling – RNM) using SystemVerilog is presented, which utilizes an efficient UVM-based methodology. The proposed approach combines the UVM capabilities with the RNM model of the SAR ADC to generate a reusable, fast, and robust verification environment with a reduced time-to-market. The testbench creation and simulation were carried out using Cadence Xcelium. The proposed verification architecture employs constrained-random stimulus generation, analog assertions, and coverage metrics to enhance verification effectiveness. Additionally, aim of this work is to emphasize on the RNM efficiency with SystemVerilog, and apply its modeling capabilities for a SAR ADC. The presented real number model was compared to a Verilog-AMS model. The conducted experiments provided evidence that the proposed RNM model exhibits a significant improvement in simulation efficiency compared to previous works documented in the literature (simulation time was at 0.5 s, compared to a Verilog-AMS reference model's simulation at 20 s). This improvement in efficiency is achieved without compromising on the accuracy of the simulation, ensuring that the model maintains a satisfactory level of precision. [ABSTRACT FROM AUTHOR]