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Start Over Author "Ichikawa, Tamotsu" Journal journal of electronic testing
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1. Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies

Author

Zhao, Yujie, primary, Katoh, Kentaroh, additional, Kuwana, Anna, additional, Katayama, Shogo, additional, Wei, Jianglin, additional, Kobayashi, Haruo, additional, Nakatani, Takayuki, additional, Hatayama, Kazumi, additional, Sato, Keno, additional, Ishida, Takashi, additional, Okamoto, Toshiyuki, additional, and Ichikawa, Tamotsu, additional

Published
2022
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