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Abstract: Sm–Co and Nd–Fe-B thin films have been prepared by sputtering. Particular efforts are concentrated on the perpendicular texture growth of the films. The Sm–Co and Nd–Fe–B thin films with perpendicular magnetic anisotropy can be prepared on Cu and W underlayer, respectively. Those underlayers play an important role to prevent oxidation and improve crystal lattice orientation. Perpendicular coercivity and remanent squareness ratio are higher than 10kOe and almost 1.0, respectively, in both films prepared under optimum conditions. [Copyright &y& Elsevier]

Abstract: Pt, Pd, and Pt–Pd alloy underlayers were used to deposit c-axis oriented barium ferrite (BaM) thin films by a facing target sputtering system. All of the BaM thin films grown on these three underlayers show c-axis orientation normal to the film plane. But the grain size of BaM layer is strongly manipulated by the underlayer grain size. It is found that Pt–Pd alloy underlayer is effective to achieve c-axis oriented barium ferrite films with small grain size. [Copyright &y& Elsevier]

Abstract: A new technique, which utilizes the interlayer diffusion, for preparation of self-assembled nanodot magnetic structures has been proposed. L10-phase Pt/FeCu and Pt/FeAg films have been successfully synthesized by this technique. Both the coercivity of Pt/FeCu and Pt/FeAg films exhibited, respectively 4.1 and 8.0kOe in perpendicular direction. Pt/Fe and Pt/FeAg films show positive values, while Pt/FeCu shows negative value in δm plot. The results indicate that the exchange coupling between the grains has been decoupled in the self-assembled nanodot structure in Pt/FeCu film. [Copyright &y& Elsevier]

Abstract: TiN thin film is prepared by DC reactive sputtering in Ar+N2 atmosphere and its suitability as underlayer and overlayer for TbFeCo perpendicular recording media as well as its effect on the magnetic properties of the latter have been studied. Only 5nm TiN overlayer and 20nm under layer can successfully protect the TbFeCo film from oxidation. Initially the coercivity is increased sharply from about 2 to 6kOe for an increase of underlayer thickness to 60nm then the increasing rate of coercivity becomes very slow. The saturation magnetization remains almost constant with the underlayer thickness. The remanent squareness ratio remains constant at 1.0 with the underlayer thickness up to 60nm then decreases. [Copyright &y& Elsevier]

Abstract: Strontium ferrite (SrM) thin films were deposited on thermally oxidized silicon wafer with Au underlayer. Gold underlayers were prepared at various substrate temperatures by using a magnetron sputtering system. C-axis oriented SrM perpendicular films and preferred (111) orientation of underlayer have confirmed by X-ray diffraction patterns. The intensity of (111) diffraction line for Au and that of (00 l) diffraction line for strontium ferrite decrease with increase in substrate temperature (T u) The maximum coercivity and remanent squareness ratio in perpendicular direction, at T u of 500°C, are 5.4kOe and 0.68, respectively. The strength of the intergranular interaction of SrM magnetic particles is described by the parameter Δm. The SrM/Au films prepared at T u above 100°C have smaller Δm peak values than that for SrM/Au films prepared at T u of room temperature. This behavior is related to low magnetostatic coupling between the magnetic particles separated by the non-magnetic amorphous phase. [Copyright &y& Elsevier]