14 results on '"Collins, R. W."'
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2. Characterization of cubic boron nitride growth using UV-extended real-time spectroscopic ellipsometry: Effect of plasma additions and dynamic substrate bias steps
3. Analysis of the growth processes of plasma-enhanced chemical vapor deposited diamond films from CO/H2 and CH4/H2 mixtures using real-time spectroellipsometry
4. Characterization of substrate temperature and damage in diamond growth plasmas by multichannel spectroellipsometry
5. Effect of preparation conditions on the morphology and electrochromic properties of amorphous tungsten oxide films
6. Characterization of ion beam-induced surface modification of diamond films by real time spectroscopic ellipsometry
7. Quantification of microstructural evolution in sputtered a‐Si thin films by real time spectroscopic ellipsometry
8. Ion beam etching of GaAs and GaAs/AlGaAs heterostructures probed in real time by spectroscopic ellipsometry
9. In situ ellipsometry as a diagnostic of thin‐film growth: Studies of amorphous carbon
10. Low‐energy hydrogen ion bombardment damage in silicon: An in situ optical investigation
11. Structural studies of hydrogen-bombarded silicon using ellipsometry and transmission electron microscopy
12. The effect of inert gas plasma exposure on the surface structure of hydrogenated amorphous silicon (a-Si:H)
13. The growth of thin oxides on a-Si and a-Si:H in an O2 plasma
14. In situ ellipsometry studies of the growth of hydrogenated amorphous silicon by glow discharge
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