1. Portable ultrahigh-vacuum sample storage system for polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy
- Author
-
Yoshihide Watanabe, Noritake Isomura, Atsushi Beniya, Yusaku F. Nishimura, Tomoyuki Nimura, Satoru Takakusagi, Ryo Suzuki, Hiromitsu Uehara, and Kiyotaka Asakura
- Subjects
Total internal reflection ,X-ray spectroscopy ,business.industry ,Chemistry ,Analytical chemistry ,Synchrotron radiation ,02 engineering and technology ,Surfaces and Interfaces ,010402 general chemistry ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,01 natural sciences ,Sample (graphics) ,0104 chemical sciences ,Surfaces, Coatings and Films ,X-ray absorption fine structure ,Computer data storage ,0210 nano-technology ,business ,Spectroscopy ,Absorption (electromagnetic radiation) - Abstract
A portable ultrahigh-vacuum sample storage system was designed and built to investigate the detailed geometric structures of mass-selected metal clusters on oxide substrates by polarization-dependent total-reflection fluorescence x-ray absorption fine structure spectroscopy (PTRF-XAFS). This ultrahigh-vacuum (UHV) sample storage system provides the handover of samples between two different sample manipulating systems. The sample storage system is adaptable for public transportation, facilitating experiments using air-sensitive samples in synchrotron radiation or other quantum beam facilities. The samples were transferred by the developed portable UHV transfer system via a public transportation at a distance over 400 km. The performance of the transfer system was demonstrated by a successful PTRF-XAFS study of Pt-4 clusters deposited on a TiO2(110) surface.
- Published
- 2016
- Full Text
- View/download PDF