1. Friedel-pair based indexing method for characterization of single grains with hard X-rays
- Author
-
Ar Pyzalla, Thomas Lippmann, András Borbély, Peter Kenesei, M. Moscicki, Jonathan P. Wright, Haroldo Cavalcanti Pinto, Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Gesellschaft, Inst Phys, Dept Mat Phys, Eötvös Lorand University, Eötvös Loránd University (ELTE)-Eötvös Loránd University (ELTE), European Synchrotron Radiation Facility (ESRF), GKSS Research Centre, GKSS Research Centre (GKSS), Helmholtz-Zentrum Geesthacht (GKSS)-Helmholtz-Zentrum Geesthacht (GKSS), Centre Science des Matériaux et des Structures (SMS-ENSMSE), École des Mines de Saint-Étienne (Mines Saint-Étienne MSE), Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT), UMR 5146 - Laboratoire Claude Goux (LCG-ENSMSE), Département Microstructures et Propriétés Mécaniques (MPM-ENSMSE), Institut Mines-Télécom [Paris] (IMT)-Institut Mines-Télécom [Paris] (IMT)-SMS, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (HZB), Max Planck Inst Eisenforsch GmbH, D-40237 Dusseldorf, France, GKSS Forschungszentrum Geesthacht GmbH, D-21502 Geesthacht, Helmholtz Zentrum Energie & Mat GmbH, D-14109 Berlin, Germany, Eotvos Lorand Univ, Inst Phys, Dept Mat Phys, H-1518 Budapest, Hungary, European Synchrotron Radiat Facil, and F-38043 Grenoble
- Subjects
STRAIN ,Materials science ,02 engineering and technology ,Friedel-pair ,01 natural sciences ,[SPI.MAT]Engineering Sciences [physics]/Materials ,Optics ,DEFORMATION ,Position (vector) ,POLYCRYSTALS ,Orientation (geometry) ,0103 physical sciences ,General Materials Science ,Texture (crystalline) ,LATTICE ROTATIONS ,Crystallographic orientation change INDIVIDUAL BULK GRAINS ,010302 applied physics ,business.industry ,Mechanical Engineering ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,In situ testing ,X-ray diffraction ,Computational physics ,Characterization (materials science) ,Reflection (mathematics) ,Mechanics of Materials ,GROWTH ,METALS ,Center of mass ,Crystallite ,Symmetry (geometry) ,0210 nano-technology ,business - Abstract
International audience; A new evaluation procedure is presented to characterize the orientation and position of single grains within the bulk of a polycrystalline sample. Considering the symmetry properties of Friedel-pairs the contributions to reflection spot positions arising from grain orientation and position could be clearly separated. The proposed method avoids simultaneous fitting of all grain parameters with the goal of a higher accuracy. Depending on the number of reflections considered the accuracy of grain orientation may be less than 0.1 degrees, and the position of the center of mass of the grains can be accurate within one-third of the pixel size.
- Published
- 2009
- Full Text
- View/download PDF