Author: "Alexander Nikiforov" / Journal: microelectron. reliab. - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Alexander Nikiforov"' showing total 2 results

Start Over Author "Alexander Nikiforov" Journal microelectron. reliab.

2 results on '"Alexander Nikiforov"'

1. The radiation test based assessment of process quality and reliability for conventional 65-nm CMOS technology.

Author: Leonid Kessarinskiy, Georgii Davydov, Dmitry Boychenko, A. S. Artamonov, Alexander Nikiforov, and I. B. Yashanin
Published: 2016
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2. DC-DC's total ionizing dose hardness decrease in passive reserve mode.

Author: Leonid Kessarinskiy, A. Y. Borisov, Dmitry Boychenko, and Alexander Nikiforov
Published: 2015
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