Author: "T. Idda" / Journal: microelectron. reliab. - Searchworks@Jio Institute Digital Library Search Results

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Start Over Author "T. Idda" Journal microelectron. reliab.

2 results on '"T. Idda"'

1. Life expectancy and characterization of capacitive RF MEMS switches.

Author: Mohamed Matmat, K. Koukos, Fabio Coccetti, T. Idda, Antoine Marty, Christophe Escriba, Jean-Yves Fourniols, and Daniel Estève
Published: 2010
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2. Accelerated lifetime test of RF-MEMS switches under ESD stress.

Author: Jinyu Jason Ruan, Nicolas Nolhier, George J. Papaioannou, David Trémouilles, Vincent Puyal, C. Villeneuve, T. Idda, Fabio Coccetti, and Robert Plana
Published: 2009
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