Author: "Ivankovic, Andrej" / Journal: microelectronic engineering - Searchworks@Jio Institute Digital Library Search Results

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Start Over Author "Ivankovic, Andrej" Journal microelectronic engineering

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1. Effect of 4-point bending test procedure on crack propagation in thin film stacks

Author: Ključar, Luka, Gonzalez, Mario, Vanstreels, Kris, Ivanković, Andrej, Hecker, Michael, and De Wolf, Ingrid
Published: 2015
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