12 results on '"Martín Martínez J"'
Search Results
2. A detailed study of the gate/drain voltage dependence of RTN in bulk pMOS transistors
3. MOSFET degradation dependence on input signal power in a RF power amplifier
4. Tuning the conductivity of resistive switching devices for electronic synapses
5. Efficient methodology to extract interface traps parameters for TCAD simulations
6. Non-homogeneous conduction of conductive filaments in Ni/HfO2/Si resistive switching structures observed with CAFM
7. Analysis of Set and Reset mechanisms in Ni/HfO2-based RRAM with fast ramped voltages
8. Dedicated random telegraph noise characterization of Ni/HfO2-based RRAM devices
9. Bimodal CAFM TDDB distributions in polycrystalline HfO2 gate stacks: The role of the interfacial layer and grain boundaries
10. CHC degradation of strained devices based on SiON and high- k gate dielectric materials
11. NBTI related time-dependent variability of mobility and threshold voltage in pMOSFETs and their impact on circuit performance
12. Gate dielectric degradation in CMOS inverters
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.