Author: "Afzali-Kusha, Hassan" / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

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Start Over Author "Afzali-Kusha, Hassan" Journal microelectronics reliability

1 results on '"Afzali-Kusha, Hassan"'

1. Workload and temperature dependent evaluation of BTI-induced lifetime degradation in digital circuits

Author: Eghbalkhah, Behzad, Kamal, Mehdi, Afzali-Kusha, Hassan, Afzali-Kusha, Ali, Ghaznavi-Ghoushchi, Mohammad Bagher, and Pedram, Massoud
Published: 2015
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