6 results on '"Chan, Mansun"'
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2. Practical compact modeling approaches and options for sub-0.1 μm CMOS technologies
3. Comparison of electrical stress-induced charge carrier generation/trapping and related degradation of SiO2 and HfO2/SiO2 gate dielectric stacks
4. Charge-based model for symmetric double-gate MOSFETs with inclusion of channel doping effect
5. Sub-threshold behavior of long channel undoped cylindrical surrounding-gate MOSFETs
6. Comparison of electrical stress-induced charge carrier generation/trapping and related degradation of SiO2 and HfO2/SiO2 gate dielectric stacks
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