7 results on '"Chien, Wei-Ting Kary"'
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2. Exploration of baking temperature effects on 28 nm BEOL reliability
3. Early detection and prediction of HKMG SRAM HTOL performance by WLR PBTI tests
4. Influence of I/O oxide process on the NBTI performance of 28 nm HfO2-based HKMG p-MOSFETs
5. Some practical considerations for effective and efficient wafer-level reliability control
6. Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation
7. Influence of I/O oxide process on the NBTI performance of 28nm HfO2-based HKMG p-MOSFETs
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