Author: "Guo, Yaxin" / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Guo, Yaxin"' showing total 5 results

Start Over Author "Guo, Yaxin" Journal microelectronics reliability

5 results on '"Guo, Yaxin"'

1. Analysis of the transient dose rate effect on clock resources of JXCV5SX95T FPGA

Author: Guo, Yaxin, Peng, Zhigang, Li, Yang, Liu, Jiaxin, Li, Ning, Li, Pei, Li, Yonghong, and He, Chaohui
Published: 2023
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2. Simulation analysis of electromagnetic pulse susceptibility and hardening design for system-in-package SZ0501

Author: Li, Ning, Li, Yang, Guo, Yaxin, and He, Chaohui
Published: 2023
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3. Vulnerability evaluation on 16 nm FinFET Ultrascale+ MPSoC using fault injection and proton irradiation

Author: Li, Yonghong, Yang, Weitao, Wang, Maocheng, Li, Yang, Guo, Yaxin, Li, Pei, Zhao, Haoyu, He, Chaohui, Wang, Di, Yang, Ye, Zhang, Xiaodong, and An, Heng
Published: 2022
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4. Simulation of transient dose rate effect on analog phase locked loop

Author: Li, Yang, Guo, Yaxin, Liao, Wenlong, Liu, Jiaxin, Peng, Zhigang, He, Chaohui, Li, Yonghong, and Li, Pei
Published: 2022
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5. Simulation studies on the transient dose rate effect of analog delay locked loops

Author: Li, Yang, Guo, Yaxin, He, Chaohui, Liu, Jiaxin, Li, Yonghong, and Li, Pei
Published: 2021
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