Author: "Haendler, S." / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Haendler, S."' showing total 4 results

Start Over Author "Haendler, S." Journal microelectronics reliability

4 results on '"Haendler, S."'

1. Intrinsic ESD robustness on new high voltage N/PMOS devices in 28 nm FDSOI UTBB CMOS technology through TLP/VFTLP characterizations

Author: Galy, Ph., Jacquier, B., and Haendler, S.
Published: 2021
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2. Hot-carrier evaluation of a zero-cost transistor developed via process optimization in an embedded non-volatile memory CMOS technology

Author: Devoge, P., Aziza, H., Lorenzini, P., Julien, F., Marzaki, A., Malherbe, A., Mantelli, M., Cabout, T., Delalleau, J., Haendler, S., Regnier, A., and Niel, S.
Published: 2021
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3. Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors

Author: Haendler, S, Jomaah, J, Ghibaudo, G, and Balestra, F
Published: 2001
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4. Dispersion study of DC and Low Frequency Noise in SiGe:C Heterojunction Bipolar Transistors used for mm-Wave to Terahertz applications

Author: Seif, M., primary, Pascal, F., additional, Sagnes, B., additional, Hoffmann, A., additional, Haendler, S., additional, Chevalier, P., additional, and Gloria, D., additional
Published: 2014
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