147 results on '"Iannuzzo, F."'
Search Results
2. Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis
3. A non-invasive SiC MOSFET Junction temperature estimation method based on the transient light Emission from the intrinsic body diode
4. Parameters sensitivity analysis of silicon carbide buck converters to extract features for condition monitoring
5. Study of moisture transport in silicone gel for IGBT modules
6. FEM-aided damage model calibration method for experimental results
7. Evaluating IGBT temperature evolution during short circuit operations using a TSEP-based method
8. Implications of short-circuit events on power cycling of 1.2-kV/20-A SiC MOSFET power modules
9. SiC MOSFET vs SiC/Si Cascode short circuit robustness benchmark
10. Impact of device aging in the compact electro-thermal modeling of SiC power MOSFETs
11. Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactions
12. Smart SiC MOSFET accelerated lifetime testing
13. Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter
14. Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature swings
15. Failure mechanism analysis of fuses subjected to manufacturing and operational thermal stresses
16. Investigation of acoustic emission as a non-invasive method for detection of power semiconductor aging
17. Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules
18. Advanced power cycler with intelligent monitoring strategy of IGBT module under test
19. Capacitive effects in IGBTs limiting their reliability under short circuit
20. A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis
21. Reliability-oriented environmental thermal stress analysis of fuses in power electronics
22. Mission-profile-based stress analysis of bond-wires in SiC power modules
23. Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT
24. Power cycling test and failure analysis of molded Intelligent Power IGBT Module under different temperature swing durations
25. Robustness of MW-Level IGBT modules against gate oscillations under short circuit events
26. Experimental study of Single Event Effects induced by heavy ion irradiation in enhancement mode GaN power HEMT
27. Junction temperature estimation method for a 600 V, 30A IGBT module during converter operation
28. Turn-off instabilities in large area IGBTs
29. Thermal damage in SiC Schottky diodes induced by SE heavy ions
30. Scattering parameter approach applied to the stability analysis of power IGBTs in short circuit
31. Thermal instability during short circuit of normally-off AlGaN/GaN HFETs
32. Behavior of power MOSFETs during heavy ions irradiation performed after γ-rays exposure
33. Unclamped repetitive stress on 1200 V normally-off SiC JFETs
34. Reliability oriented design of power supplies for high energy physics applications
35. A new test methodology for an exhaustive study of single-event-effects on power MOSFETs
36. Experimental study and numerical investigation on the formation of single event gate damages induced on medium voltage power MOSFET
37. Instable mechanisms during unclamped operation of high power IGBT modules
38. Experimental study about gate oxide damages in patterned MOS capacitor irradiated with heavy ions
39. Experimental evidence of “latent gate oxide damages” in medium voltage power MOSFET as a result of heavy ions exposure
40. IGBT modules robustness during turn-off commutation
41. High performance, FPGA-based test apparatus for unclamped inductive switching of IGBTs
42. The robustness of series-connected high power IGBT modules
43. Experimental study of power MOSFET’s gate damage in radiation environment
44. The high frequency behaviour of high voltage and current IGBT modules
45. Investigation of MOSFET failure in soft-switching conditions
46. Experimental and Numerical investigation about SEB/SEGR of Power MOSFET
47. Analysis and optimisation through innovative driving strategy of high power IGBT performances/EMI reduction trade-off for converter systems in railway applications
48. Non-Destructive Detection of Current Distribution in Power Modules based on Pulsed Magnetic Measurement
49. Reliability of Medium Blocking Voltage Power VDMOSFET in Radiation Environment
50. Experimental study of charge generation mechanisms in power MOSFETs due to energetic particle impact
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.