18 results on '"Kaczer, B."'
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2. Comphy — A compact-physics framework for unified modeling of BTI
3. A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability
4. FinFET and MOSFET preliminary comparison of gate oxide reliability
5. A new method for the analysis of high-resolution SILC data
6. High-resolution SILC measurements of thin SiO 2 at ultra low voltages
7. Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study
8. Degradation and breakdown in thin oxide layers: mechanisms, models and reliability prediction
9. Circuit simulation of workload-dependent RTN and BTI based on trap kinetics
10. Energy distribution of positive charges in high-k dielectric
11. Defect-centric perspective of time-dependent BTI variability
12. BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic
13. A CMOS circuit for evaluating the NBTI over a wide frequency range
14. Gate oxide breakdown in FET devices and circuits: From nanoscale physics to system-level reliability
15. NBTI reliability of Ni FUSI/HfSiON gates: Effect of silicide phase
16. High-resolution SILC measurements of thin SiO2 at ultra low voltages
17. Ultra-thin oxide reliability: searching for the thickness scaling limit
18. High-resolution SILC measurements of thin SiO2 at ultra low voltages
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