Author: "Kaczer, Ben" / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

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Start Over Author "Kaczer, Ben" Journal microelectronics reliability

4 results on '"Kaczer, Ben"'

1. Comphy v3.0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices

Author: Waldhoer, Dominic, Schleich, Christian, Michl, Jakob, Grill, Alexander, Claes, Dieter, Karl, Alexander, Knobloch, Theresia, Rzepa, Gerhard, Franco, Jacopo, Kaczer, Ben, Waltl, Michael, and Grasser, Tibor
Published: 2023
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2. Extensive assessment of the charge-trapping kinetics in InGaAs MOS gate-stacks for the demonstration of improved BTI reliability

Author: Putcha, Vamsi, Franco, Jacopo, Vais, Abhitosh, Kaczer, Ben, Xie, Qi, Maes, Jan Willem, Tang, Fu, Givens, Michael, Collaert, Nadine, Linten, Dimitri, and Groeseneken, Guido
Published: 2020
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3. Separation of electron and hole trapping components of PBTI in SiON nMOS transistors

Author: Waltl, Michael, Stampfer, Bernhard, Rzepa, Gerhard, Kaczer, Ben, and Grasser, Tibor
Published: 2020
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4. Progressive breakdown in ultrathin SiON dielectrics and its effect on transistor performance

Author: O’Connor, Robert, Hughes, Greg, Degraeve, Robin, and Kaczer, Ben
Published: 2005
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