Author: "Li, Wuhua" / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Li, Wuhua"' showing total 4 results

Start Over Author "Li, Wuhua" Journal microelectronics reliability

4 results on '"Li, Wuhua"'

1. Online monitoring and correction method of threshold voltage in SiC MOSFET power cycling test

Author: Wu, Qiang, Kang, Jianlong, Chen, Yu, Zheng, Fujun, Zhang, Jian, Luo, Haoze, Li, Wuhua, and Iannuzzo, Francesco
Published: 2022
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2. Hybrid domain-based fast transient thermal evaluation method for power semiconductor modules in EV motor drive

Author: Zhou, Yu, Jin, Yuting, Zhang, Yi, Luo, Haoze, Zhang, Jian, and Li, Wuhua
Published: 2022
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3. Uneven temperature effect evaluation in high-power IGBT inverter legs and relative test platform design

Author: Luo, Haoze, Li, Wuhua, He, Xiangning, Iannuzzo, Francesco, and Blaabjerg, Frede
Published: 2017
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4. Modern IGBT gate driving methods for enhancing reliability of high-power converters — An overview

Author: Luo, Haoze, Iannuzzo, Francesco, Diaz Reigosa, Paula, Blaabjerg, Frede, Li, Wuhua, and He, Xiangning
Published: 2016
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