Author: "Lv, Yinghuan" / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Lv, Yinghuan"' showing total 3 results

Start Over Author "Lv, Yinghuan" Journal microelectronics reliability

3 results on '"Lv, Yinghuan"'

1. Area-efficient radiation-hardened 6 T SOI SRAM cell design using TDBC Transistors

Author: Lv, Yinghuan, Xie, Tiantian, Liu, Yulan, Ren, Zhipeng, and Chen, Jing
Published: 2023
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2. A highly reliable radiation hardened 8T SRAM cell design

Author: Lv, Yinghuan, Wang, Qing, Ge, Hao, Xie, Tiantian, and Chen, Jing
Published: 2021
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3. The impact of total ionizing dose on RF performance of 130 nm PD SOI I/O nMOSFETs

Author: Xie, Tiantian, Ge, Hao, Lv, Yinghuan, and Chen, Jing
Published: 2021
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