31 results on '"Meneghesso, Gaudenzio"'
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2. Role of p-GaN layer thickness in the degradation of InGaN-GaN MQW solar cells under 405 nm laser excitation
3. Modeling the electrical characteristic of InGaN/GaN blue-violet LED structure under electrical stress
4. Impact of an AlGaN spike in the buffer in 0.15 μm AlGaN/GaN HEMTs during step stress
5. Electrical, optical characterization and degradation of Cu(InGa)Se2 devices with fluorine-doped tin oxide back contact
6. Short term reliability and robustness of ultra-thin barrier, 110 nm-gate AlN/GaN HEMTs
7. Influence of CdTe solar cell properties on stability at high temperatures
8. A novel on-wafer approach to test the stability of GaN-based devices in hard switching conditions: Study of hot-electron effects
9. BTI saturation and universal relaxation in SiC power MOSFETs
10. Reliability investigation on CdTe solar cells submitted to short-term thermal stress
11. Investigation of the degradations in power GaN-on-Si MIS-HEMTs subjected to cumulative γ-ray irradiation
12. Field and hot electron-induced degradation in GaN-based power MIS-HEMTs
13. Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis
14. Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate
15. Editorial
16. Failure modes and mechanisms of InP-based and metamorphic high electron mobility transistors
17. DC and pulsed measurements of on-state breakdown voltage in GaAs MESFETs and InP-based HEMTs
18. Cathodoluminescence from hot electron stressed InP HEMTs
19. ESD degradation and robustness of RGB LEDs and modules: An investigation based on combined electrical and optical measurements
20. Thermal and electrical investigation of the reverse bias degradation of silicon solar cells
21. Statistics and localisation of vertical breakdown in AlGaN/GaN HEMTs on SiC and Si substrates for power applications
22. Editorial
23. Chip and package-related degradation of high power white LEDs
24. ESD sensitivity of a GaAs MMIC microwave power amplifier
25. Experimental and simulated dc degradation of GaN HEMTs by means of gate-drain and gate-source reverse bias stress
26. Reliability evaluation for Blu-Ray laser diodes
27. Reliability analysis of InGaN Blu-Ray laser diode
28. Thermal storage effects on AlGaN/GaN HEMT
29. INTRODUCTORY INVITED PAPERFailure mechanisms due to metallurgical interactions in commercially available AlGaAs/GaAs and AlGaAs/InGaAs HEMTs
30. A study of hot-electron degradation effects in pseudomorphic HEMTs
31. Failure mechanisms of AlGaAs/InGaAs pseudomorphic hemt's: Effects due to hot electrons and modulation of trapped charge
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