6 results on '"Mikulla, M."'
Search Results
2. Degradation of 0.25 μm GaN HEMTs under high temperature stress test
3. Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices
4. Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs
5. Reliability and degradation mechanism of AlGaN/GaN HEMTs for next generation mobile communication systems
6. Reliability of 70 nm metamorphic HEMTs
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.