Author: "Tu, Chunming" / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

Searchworks

Select search scope, currently: Articles

Catalog

books, media & more in Jio Institute collections

Articles

journal articles & other e-resources

Your search keyword '"Tu, Chunming"' showing total 4 results

Start Over Author "Tu, Chunming" Journal microelectronics reliability

4 results on '"Tu, Chunming"'

1. Analytical modeling of thermo-mechanical stress for bond wire of IGBT module

Author: Dai, Xingyu, Yang, Xin, Wu, Xinlong, Tu, Chunming, and Liu, Guoyou
Published: 2021
Full Text: View/download PDF

2. A physical lifetime prediction methodology for IGBT module by explicit emulation of solder layer degradation

Author: Wu, Xinlong, Yang, Xin, Dai, Xingyu, Tu, Chunming, and Liu, Guoyou
Published: 2021
Full Text: View/download PDF

3. Thermal optimized discontinuous modulation strategy for three phase impedance source inverter

Author: Liu, Ping, Xu, Jie, and Tu, Chunming
Published: 2020
Full Text: View/download PDF

4. Failure modes and mechanism analysis of SiC MOSFET under short-circuit conditions

Author: Jiang, Xi, Wang, Jun, Lu, Jiwu, Chen, Jianjun, Yang, Xin, Li, Zongjian, Tu, Chunming, and Shen, Z. John
Published: 2018
Full Text: View/download PDF

Catalog

Books, media, physical & digital resources

See catalog results