Author: "Wang, Yu Yun" / Journal: microelectronics reliability - Searchworks@Jio Institute Digital Library Search Results

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Start Over Author "Wang, Yu Yun" Journal microelectronics reliability

1 results on '"Wang, Yu Yun"'

1. Relaxation analysis to understand positive bias induced trapping in ferroelectric FETs with Si and Gd dopants

Author: Wang, Yu-Yun, Wang, Kuan-Chi, Chang, Ting-Yu, Ronchi, Nicolò, O'Sullivan, Barry, Banerjee, Kaustuv, van den Bosch, Geert, Van Houdt, Jan, and Wu, Tian-Li
Published: 2022
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