13 results on '"Wu, Tian-Li"'
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2. Investigation of the time dependent gate dielectric stability in SiC MOSFETs with planar and trench gate structures
3. Dynamic on-resistance stability of SiC and GaN power devices during high-frequency (100–300 kHz) hard switching and zero voltage switching operations
4. Relaxation analysis to understand positive bias induced trapping in ferroelectric FETs with Si and Gd dopants
5. Demonstration of Schottky barrier diode integrated in 200 V power p-GaN HEMTs technology with robust stability
6. Stability of wireless power transfer using gamma-ray irradiated GaN power HEMTs
7. Analysis of the subthreshold characteristics in AlGaN/GaN HEMTs with a p-GaN gate
8. Time-dependent dielectric breakdown of gate oxide on 4H-SiC with different oxidation processes
9. Investigation of the passivation-induced VTH shift in p-GaN HEMTs with Au-free gate-first process
10. Investigation of the degradations in power GaN-on-Si MIS-HEMTs subjected to cumulative γ-ray irradiation
11. Study of the stability of e-mode GaN HEMTs with p-GaN gate based on combined DC and optical analysis
12. Trapping and reliability issues in GaN-based MIS HEMTs with partially recessed gate
13. Stability evaluation of Au-free Ohmic contacts on AlGaN/GaN HEMTs under a constant current stress
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