6 results on '"Zhai, Guofu"'
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2. Degradation mechanisms-based reliability modeling for metallized film capacitors under temperature and voltage stresses
3. Reliability assessment of film capacitors oriented by dependent and nonlinear degradation considering three-source uncertainties
4. Life-cycle reliability design optimization of high-power DC electromagnetic devices based on time-dependent non-probabilistic convex model process
5. Solving Time-dependent reliability-based design optimization by adaptive differential evolution algorithm and time-dependent polynomial chaos expansions (ADE-T-PCE)
6. The threshold voltage degradation model of N Channel VDMOSFETs under PBT stress
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