22 results on '"Voyles, Paul M."'
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2. Deep Learning Approach for High-accuracy Electron Counting of Monolithic Active Pixel Sensor-type Direct Electron Detectors at Increased Electron Dose.
3. Benchmark Tests of Atom Segmentation Deep Learning Models with a Consistent Dataset.
4. Deep Learning Approach for High-accuracy Electron Counting of Direct Electron Detectors at Increased Electron Dose.
5. Infrastructure for Analysis of Large Microscopy and Microanalysis Data Sets.
6. 4D STEM with an Ultrafast Camera Reveals Mesoscale Structure in Anisotropic Molecular Glass Thin Films.
7. Optimizing Nonrigid Registration for Scanning Transmission Electron Microscopy Image Series.
8. pyxem: A Scalable Mature Python Package for Analyzing 4-D STEM Data.
9. 5D-STEM of Real- and Reciprocal-space Resolved Dynamics in a Metallic Liquid.
10. Foundry-ML: a Platform for FAIR Machine Learning in Materials Science.
11. Electron Correlation Microscopy: A New Technique for Studying Local Atom Dynamics Applied to a Supercooled Liquid.
12. Thickness Variations and Absence of Lateral Compositional Fluctuations in Aberration-Corrected STEM Images of InGaN LED Active Regions at Low Dose.
13. Multiple Morphologies of Gold–Magnetite Heterostructure Nanoparticles are Effectively Functionalized with Protein for Cell Targeting.
14. Identification and Quantification of Boron Dopant Sites in Antiferromagnetic Cr2O3 Films by Electron Energy Loss Spectroscopy.
15. Joint Denoising and Distortion Correction for Atomic Column Detection in Scanning Transmission Electron Microscopy Images.
16. Applications of High Precision STEM Imaging to Structurally Complex Materials.
17. Dielectric breakdown along c-axis boundaries in magnetoelectric Cr2O3 for spintronic devices.
18. Bayesian Statistical Model for Imaging of Single La Vacancies in LaMnO3.
19. Atomic-scale Relaxation Dynamics in the Supercooled Liquid State of a Metallic Glass Nanowire by Electron Correlation Microscopy.
20. Morphology of Amorphous Pockets in SiC Irradiated with 1 MeV Kr Ions.
21. Precision Limits to STEM Imaging from Dynamical Scattering and Channeling of Sub-Angstrom Electron Probes.
22. Evidence from Simulations for Orientational Medium Range Order in Fluctuation-Electron-Microscopy Observations of a-Si.
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