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Dark-field x-ray microscopy is a new way to three-dimensionally map lattice strain and orientation in crystalline matter. It is analogous to dark-field electron microscopy in that an objective lens magnifies diffracting features of the sample; however, the use of high-energy synchrotron x-rays means that these features can be large, deeply embedded, and fully mapped in seconds to minutes. Simple reconfiguration of the x-ray objective lens allows intuitive zooming between different scales down to a spatial and angular resolution of 100 nm and 0.001°, respectively. Three applications of the technique are presented—mapping the evolution of subgrains during the processing of plastically deformed aluminum, mapping domains and strain fields in ferroelectric crystals, and the three-dimensional mapping of strain fields around individual dislocations. This ability to directly characterize complex, multiscale phenomena in situ is a key step toward formulating and validating multiscale models that account for the entire heterogeneity of materials. [ABSTRACT FROM PUBLISHER]

Synchrotron radiation has evolved tremendously in recent decades in sources, instrumentation, and applications in materials studies. This article provides background and an introduction to the state of the art of synchrotron research as it relates to materials research, including an overview of the articles in this MRS Bulletin issue, which focus on Laue microdiffraction, high-energy x-ray diffraction on battery materials, synchrotron radiation in high-pressure research, x-ray dark-field microscopy, and x-ray absorption spectroscopy applied to energy research. The modern approach of displaying diffraction data in reciprocal-space units and the distinction between spectroscopy and diffraction are summarized. Applications and technologies are continuously developing toward technical and optical limits, combining multiple methods for an even brighter future for this field. It is now time for expert groups to begin applying multiple and different kinds of quantum beams, such as neutrons, muons, electrons, and ions, complementary to synchrotron radiation for more efficient and effective characterization of materials. [ABSTRACT FROM PUBLISHER]