5 results on '"Haspeslagh, L."'
Search Results
2. Evaluation of the Electrical Properties, Piezoresistivity and Noise of poly-SiGe for MEMS-above-CMOS applications
3. Stress evolution in integrated SrBi2Ta2O9 ferroelectric layers
4. Evaluation of the Electrical Properties, Piezoresistivity and Noise of poly-SiGe for MEMS-above-CMOS applications.
5. Stress evolution in integrated SrBi2Ta2O9 ferroelectric layers.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.