16 results on '"Kamins, T. I."'
Search Results
2. A Stem Study of P and Ge Segregation to Grain Boundaries in Si1-xGex Thin Films
3. Resistivity and Hall Voltage Investigation of Phosphorus Segregation in Polycrystalline Si1-xGex Thin Films
4. High Resolution Electron Microscopy (HREM) Study of Chemically Vapor Deposited Polycrystalline Si1-xGex Thin Films
5. Resistivity and Hall Voltage Investigation of Phosphorus Segregation in Polycrystalline Si1-xGex Thin Films.
6. A Stem Study of P and Ge Segregation to Grain Boundaries in Si1-xGex Thin Films.
7. Epitaxial Growth of Sil-xGex/Si Heterostructures by Limited Reaction Processing for Minority Carrier Device Applications.
8. Onset of Misfit Dislocation Generation in As-Grown and Annealed Sil-XGex/Si Films.
9. Growth of Gallium Arsenide on Silicon in Masked, Etched Trenches.
10. Electrical Properties of Polycrystalline-Silicon Thin Films for VLSI.
11. Heavy Metal Gettering in Implanted Buried-Oxide Structures.
12. Offset-Gate Structures for Increased Breakdown Voltages in Silicon-On-Insulator Transistors.
13. Laser–Recrystallized SOI Devices: Promises and Pitfalls.
14. Lateral Seeding of Silicon-On-Insulator Using an Elliptical Laser Beam: A Comparison of Scanning Methods.
15. Diffusion of Ge Along Grain Boundaries During Oxidation of Polycrystalline Silicon-Germanium Films.
16. The Extraction of Minority Carrier Lifetime from the Current-Voltage Characteristics of Si/Si1−xGex Devices.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.