1. Direct Imaging of Current-Induced Antiferromagnetic Switching Revealing a Pure Thermomagnetoelastic Switching Mechanism in NiO
- Author
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Olena Gomonay, Hendrik Meer, C. Schmitt, Lorenzo Baldrati, Mathias Kläui, Eiji Saitoh, Jairo Sinova, Felix Schreiber, and Rafael Ramos
- Subjects
Materials science ,Magnetic domain ,530 Physics ,FOS: Physical sciences ,Bioengineering ,02 engineering and technology ,Thermal ,Mesoscale and Nanoscale Physics (cond-mat.mes-hall) ,Antiferromagnetism ,Torque ,General Materials Science ,Condensed Matter - Materials Science ,Condensed Matter - Mesoscale and Nanoscale Physics ,Condensed matter physics ,Spintronics ,Mechanical Engineering ,Non-blocking I/O ,Materials Science (cond-mat.mtrl-sci) ,General Chemistry ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,530 Physik ,Mechanism (engineering) ,Condensed Matter::Strongly Correlated Electrons ,Current (fluid) ,0210 nano-technology - Abstract
We unravel the origin of current-induced magnetic switching of insulating antiferromagnet/heavy metal systems. We utilize concurrent transport and magneto-optical measurements to image the switching of antiferromagnetic domains in specially engineered devices of NiO/Pt bilayers. Different electrical pulsing and device geometries reveal different final states of the switching with respect to the current direction. We can explain these through simulations of the temperature induced strain and we identify the thermomagnetoelastic switching mechanism combined with thermal excitations as the origin, in which the final state is defined by the strain distributions and heat is required to switch the antiferromagnetic domains. We show that such a potentially very versatile non-contact mechanism can explain the previously reported contradicting observations of the switching final state, which were attributed to spin-orbit torque mechanisms.
- Published
- 2020