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Gain suppression effects and destructive events caused by highly energetic single particles should be considered for the operation of LGADs in experiments. The performance of the LGADs depends on the particle's ionization density (energy loss) as well as incident angle, while large deposits of energy in the active zone of LGADs operated at high bias voltages can lead to the destructive break down of the sensor. Herein, we summarize the main findings from a study at the ELI Beamlines laser facility and from an ionized dense charge induced gain suppression (GS) study using a nuclear microbeam probe station and MeV ions at Ruder Boskovic Institute (RBI). The transient currents technique (TCT) with a fs-laser has been used for the SEB study, while the Ion Beam Induced Charge (IBIC) technique has been employed for the GS study. [ABSTRACT FROM AUTHOR]

A feasibility study conducted at the laser facility ELI Beamlines confirms that fs-laser pulses can produce Single Event Effect (SEE), Single Event Upset (SEU) and Single Event Burnout (SEB) conditions in irradiated Low Gain Avalanche Detectors (LGADs) and the corresponding PIN diodes. A comprehensive and systematic study on PIN and LGAD mortality has been conducted to experimentally determine the stability, instability, and irreversible damage thresholds for LGADs and PINs exploiting a fs-laser system. Thresholds are given as sets of two parameters: bias voltage and laser pulse energy (energy deposition threshold). Using the Two-Photon Absorption (TPA) - Transient Current Technique (TCT) to study the mechanism that triggers SEU/SEB conditions in LGADs, as a function of illumination position establishes this technique as a promising tool for more advanced explorations of SEE, not only in LGADs but also in other Si-based sensors. To achieve these results, a highly flexible and versatile fs-laser-based TCT experimental setup has been developed at ELI Beamlines, allowing two TCT modalities with the same setup: Single Photon Absorption (SPA) at 800 nm laser wavelength and TPA at 1550 nm. [ABSTRACT FROM AUTHOR]

In this article, we present our research on the space-charge effects in segmented LGADs, specifically the interpad (IP) region, with a focus on double trench isolated LGADs (2Tr TI-LGADs). We found that the examined 2Tr sample showed different induced current signals in the IP region compared to previously studied sensors with different isolation structures. We identified two types of laser pulse induced signals in the IP region: "normal" signal, resembling corresponding pad signals, and "strong" signal represented by significantly broader waveforms with several times higher amplitude. In addition, randomly occurring "ghost" signal appearing in biased but not laser-illuminated sensors were identified during our study. All three types of signals were explored in terms of the influence of bias voltage and laser power at different temperatures. Possible explanations of the observed signals are discussed. [ABSTRACT FROM AUTHOR]