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Abstract: In this work, a sol–gel route was used to prepare Y0.9Er0.1Al3(BO3)4 glassy thin films by spin-coating technique looking for the preparation and optimization of planar waveguides for integrated optics. The films were deposited on silica and silicon substrates using stable sols synthesized by the sol–gel process. Deposits with thicknesses ranging between 520 and 720nm were prepared by a multi-layer process involving heat treatments at different temperatures from glass transition to the film crystallization and using heating rates of 2°C/min. The structural characterization of the layers was performed by using grazing incidence X-ray diffraction and Raman spectroscopy as a function of the heat treatment. Microstructural evolution in terms of annealing temperatures was followed by high resolution scanning electron microscopy and atomic force microscopy. Optical transmission spectra were used to determine the refractive index and the film thicknesses through the envelope method. The optical and guiding properties of the films were studied by m-line spectroscopy. The best films were monomode with 620nm thickness and a refractive index around 1.664 at 980nm wavelength. They showed good waveguiding properties with high light-coupling efficiency and low propagation loss at 632.8 and 1550nm of about 0.88dB/cm. [Copyright &y& Elsevier]

Optically active Y2-xErxTi2O7 (YETO) thin films have been successfully deposited using the aerosol–gel process. The effects of post-deposition rapid thermal annealing and conventional thermal annealing heat-treatments have been investigated. The corresponding thin film microstructure is described and discussed in terms of crystallisation degree, mean crystallite size, and porosity. Strong photoluminescence (PL) at 1.53 μm is observed under 980 nm excitation. PL properties are found to depend closely on the film crystallisation degree. PL emission spectra exhibit sharp peaks for crystalline films and a wide band for amorphous ones. PL decay curves are also very closely related to the film microstructure and the corresponding lifetimes range between 2 and 7 ms for a similar erbium concentration. [Copyright &y& Elsevier]