1. Structure and morphology of YBa2Cu3O7−x LPCVD layers
- Author
-
P. Germi, L. Hubert, Roland Madar, François Weiss, M. Pernet, M. Ingold, F. Labrize, Olivier P. Thomas, Eric Mossang, Jean-Pierre Senateur, and J. Fick
- Subjects
Materials science ,Scanning electron microscope ,business.industry ,Analytical chemistry ,Energy Engineering and Power Technology ,Substrate (electronics) ,Chemical vapor deposition ,Condensed Matter Physics ,Electronic, Optical and Magnetic Materials ,Monocrystalline silicon ,Magnetization ,Optics ,Electrical resistivity and conductivity ,Electrical and Electronic Engineering ,Thin film ,business ,Single crystal - Abstract
Thin films of YBa 2 Cu 3 O 7−x have been grown by chemical vapor deposition at 825 °C (5 Torr). The starting materials are tetramethylheptanedionates of Y, Ba and Cu. The superconducting properties of the films obtained on monocrystalline MgO have been studied by AC resistivity, AC susceptibility and magnetization measurements. Superconducting layers with zero resistance at 85 K and a transition width lower than 2 K are obtained. This communication will address more specifically the structural properties as well as the morphology of the layers. The films are highly orientated with their c-axis perpendicular to the substrate plane, and the pole figures show a very good in-plane orientation. The morphology of the layers has been investigated by scanning electron microscopy: we do observe a strong correlation between the roughness of the surface and the composition of the gas phase.
- Published
- 1991
- Full Text
- View/download PDF