1. An evaluation method for nanoscale wrinkle.
- Author
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Liu, Y.P., Wang, C.G., Zhang, L.M., and Tan, H.F.
- Subjects
- *
NANOCHEMISTRY , *FOURIER transforms , *WAVELENGTHS , *TWO-dimensional models , *THIN films - Abstract
In this paper, a spectrum-based wrinkling analysis method via two-dimensional Fourier transformation is proposed aiming to solve the difficulty of nanoscale wrinkle evaluation. It evaluates the wrinkle characteristics including wrinkling wavelength and direction simply using a single wrinkling image. Based on this method, the evaluation results of nanoscale wrinkle characteristics show agreement with the open experimental results within an error of 6%. It is also verified to be appropriate for the macro wrinkle evaluation without scale limitations. The spectrum-based wrinkling analysis is an effective method for nanoscale evaluation, which contributes to reveal the mechanism of nanoscale wrinkling. [ABSTRACT FROM AUTHOR]
- Published
- 2016
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