1. Ejected-electron spectroscopy of autoionizing resonances of helium excited by fast-electron impact.
- Author
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Zhe Zhang, Xu Shan, Enliang Wang, and Xiangjun Chen
- Subjects
- *
ELECTRON spectroscopy , *AUGER effect , *HELIUM , *ELECTRONIC excitation , *PARAMETER estimation , *SCIENTIFIC observation - Abstract
The autoionizing resonances (2s2)1S, (2p2)1D, and (2s2p)1P of helium have been investigated employing ejected-electron spectroscopy by fast-electron impact at incident energies of 250-2000 eV and ejected angles of 26°-116°. Shore parameters of the line shapes for these three resonances have been obtained in such high incident energy regime except at 250 eV. Distinct discrepancies between the present results at 250 eV and those of McDonald and Crowe at 200 eV [D. G. McDonald and A. Crowe, J. Phys. B 25, 2129 (1992); 25, 4313 (1992)] and Sise et al. at 250 eV [O. Sise, M. Dogan, I. Okur, and A. Crowe, Phys. Rev. A 84, 022705 (2011)], especially for 1D and 1P states, are also observed. [ABSTRACT FROM AUTHOR]
- Published
- 2012
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