1. Distance upon contact: Determination from roughness profile
- Author
-
Vitaly B. Svetovoy, Georgios Palasantzas, P. J. van Zwol, Zernike Institute for Advanced Materials, Nanostructured Materials and Interfaces, and Nanotechnology and Biophysics in Medicine (NANOBIOMED)
- Subjects
Materials science ,Scale (ratio) ,metallic thin films ,rough surfaces ,FOS: Physical sciences ,Geometry ,Surface finish ,ADHESION ,Nominal size ,electrical contacts ,Mesoscale and Nanoscale Physics (cond-mat.mes-hall) ,Surface roughness ,Condensed Matter - Mesoscale and Nanoscale Physics ,CASIMIR FORCE ,SURFACES ,semiconductor-metal boundaries ,METIS-264315 ,Radius ,gold ,Condensed Matter Physics ,EWI-17170 ,Electrical contacts ,Electronic, Optical and Magnetic Materials ,Casimir effect ,Condensed Matter - Other Condensed Matter ,surface roughness ,IR-69465 ,Contact area ,Other Condensed Matter (cond-mat.other) - Abstract
The point at which two random rough surfaces make contact takes place at the contact of the highest asperities. The distance upon contact d_0 in the limit of zero load has crucial importance for determination of dispersive forces. Using gold films as an example we demonstrate that for two parallel plates d_0 is a function of the nominal size of the contact area L and give a simple expression for d_0(L) via the surface roughness characteristics. In the case of a sphere of fixed radius R and a plate the scale dependence manifests itself as an additional uncertainty \delta d(L) in the separation, where the scale L is related with the separation d via the effective area of interaction L^2\sim\pi Rd. This uncertainty depends on the roughness of interacting bodies and disappears in the limit L\to \infty., Comment: 5 pages, 4 figures, to be published in PRB
- Published
- 2009
- Full Text
- View/download PDF