1. Avalanche statistics from data with low time resolution
- Author
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Jonathan T. Uhl, Aya Nawano, Xiaojun Gu, Michael LeBlanc, Wendelin J. Wright, and Karin A. Dahmen
- Subjects
Series (mathematics) ,business.industry ,Computer science ,Resolution (electron density) ,Poison control ,02 engineering and technology ,021001 nanoscience & nanotechnology ,01 natural sciences ,Optics ,0103 physical sciences ,Data analysis ,Cutoff ,Microplasticity ,Statistical physics ,010306 general physics ,0210 nano-technology ,business ,Scaling ,Critical exponent - Abstract
Extracting avalanche distributions from experimental microplasticity data can be hampered by limited time resolution. We compute the effects of low time resolution on avalanche size distributions and give quantitative criteria for diagnosing and circumventing problems associated with low time resolution. We show that traditional analysis of data obtained at low acquisition rates can lead to avalanche size distributions with incorrect power-law exponents or no power-law scaling at all. Furthermore, we demonstrate that it can lead to apparent data collapses with incorrect power-law and cutoff exponents. We propose new methods to analyze low-resolution stress-time series that can recover the size distribution of the underlying avalanches even when the resolution is so low that naive analysis methods give incorrect results. We test these methods on both downsampled simulation data from a simple model and downsampled bulk metallic glass compression data and find that the methods recover the correct critical exponents.
- Published
- 2016
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