1. Angstrom-Resolved Interfacial Structure in Buried Organic-Inorganic Junctions.
- Author
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Schwartz, Craig P, Raj, Sumana L, Jamnuch, Sasawat, Hull, Chris J, Miotti, Paolo, Lam, Royce K, Nordlund, Dennis, Uzundal, Can B, Das Pemmaraju, Chaitanya, Mincigrucci, Riccardo, Foglia, Laura, Simoncig, Alberto, Coreno, Marcello, Masciovecchio, Claudio, Giannessi, Luca, Poletto, Luca, Principi, Emiliano, Zuerch, Michael, Pascal, Tod A, Drisdell, Walter S, and Saykally, Richard J
- Subjects
General Physics ,Mathematical Sciences ,Physical Sciences ,Engineering - Abstract
Charge transport processes at interfaces play a crucial role in many processes. Here, the first soft x-ray second harmonic generation (SXR SHG) interfacial spectrum of a buried interface (boron-Parylene N) is reported. SXR SHG shows distinct spectral features that are not observed in x-ray absorption spectra, demonstrating its extraordinary interfacial sensitivity. Comparison to electronic structure calculations indicates a boron-organic separation distance of 1.9 Å, with changes of less than 1 Å resulting in easily detectable SXR SHG spectral shifts (ca. hundreds of milli-electron volts).
- Published
- 2021