5 results on '"Tortai, J.-H."'
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2. Ellipsometry studies of the kinetic of deprotection of thin 193 nm positive tone resist film.
3. Overcoming pattern collapse on e-beam and EUV lithography.
4. Overcoming pattern collapse of ultra high resolution dense lines obtained with EUV resists.
5. Gaussian beam writing strategy: accuracy of using the shape beam simulator SELID for Gaussian beam systems.
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