Author: "Tsai, Yi-Pei" / Journal: proceedings of spie - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Tsai, Yi-Pei"' showing total 5 results

Start Over Author "Tsai, Yi-Pei" Journal proceedings of spie

5 results on '"Tsai, Yi-Pei"'

1. Productivity enhancement study: yield, cost, and turn-around-time modeling for EUV and high NA EUV

Author: Kim, Ryoung-Han, Lafferty, Neal V., Tsai, Yi-Pei, Chang, Yi-Han, Wang, Jane, Trivkovic, Darko, Ronse, Kurt, and Kim, Ryoung-Han
Published: 2023
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2. Study of EUV stochastic defect on wafer yield

Author: Lafferty, Neal V., Grunes, Harsha, Tsai, Yi-Pei, Chang, Chieh-Miao, Chang, Yi-Han, Oak, Apoorva, Trivkovic, Darko, and Kim, Ryoung-Han
Published: 2024
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3. Productivity enhancement study: yield, cost, and turn-around-time modeling for EUV and high NA EUV.

Author: Tsai, Yi-Pei, Chang, Yi-Han, Wang, Jane, Trivkovic, Darko, Ronse, Kurt, and Kim, Ryoung-Han
Published: 2023
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4. A yield prediction model and cost of ownership for productivity enhancement beyond imec 5nm technology node.

Author: Tsai, Yi-Pei, Chang, Yi-Han, Wang, Jane, Trivkovic, Darko, Ronse, Kurt, and Kim, Ryoung-Han
Published: 2022
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5. A yield prediction model and cost of ownership for productivity enhancement beyond imec 5nm technology node

Author: Kim, Ryoung-Han, Lafferty, Neal V., Tsai, Yi-Pei, Chang, Yi-Han, Wang, Jane, Trivkovic, Darko, Ronse, Kurt, and Kim, Ryoung-Han
Published: 2022
Full Text: View/download PDF

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