1. Use of higher-order reflection from mica crystals in x-ray spectroscopic investigations at 0.1–0.3 nm
- Author
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Vera M. Romanova, E. Förster, J Wolf, S. A. Pikuz, Tatiana A. Shelkovenko, A. Ya. Faenov, T A Pikuz, and O Wehrhan
- Subjects
Materials science ,business.industry ,Statistical and Nonlinear Physics ,Radius ,Laser ,Molecular physics ,Atomic and Molecular Physics, and Optics ,Spectral line ,Electronic, Optical and Magnetic Materials ,Ion ,law.invention ,Crystal ,Optics ,Reflection (mathematics) ,law ,Mica ,Electrical and Electronic Engineering ,Spectral resolution ,business - Abstract
Crystallographic and dispersion characteristics of mica at high (V—XI) reflection orders were investigated for the first time. Even the order-XI integral reflection was sufficiently strong to be used in experiments. High-precision bending of a mica crystal along a spherical surface with a small radius R = 100 mm and the use of such crystal analysers in focusing spectrographs with one-dimensional and two-dimensional spatial resolution made it possible to record low-intensity spectra of multiply charged ions in laser and Z-pinch plasmas. The method provides exceptional spectral resolution λ/Δλ ≈ 6000–10 000 in a wide spectral range (0.15–1.8 nm).
- Published
- 1995
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